Metrology for nanotechnology
A workshop on metrology for nanotechnology will take place on 14 and 15 June in Turin, Italy.
The event will be application-oriented, and will incorporate real industrial experiences and needs. It will bring together industrial users and experts from Italy's metrology community, as well as some international experts, to discuss needs in nanometrology and recent developments, particularly with reference to techniques and methods of measurement, instrumentation and standards.
Thematic sessions will address:
- nanofabrication, top-down techniques, nanoelectronics, quantum devices;
- surfaces, layers and atomic scale metrology;
- nanostructured materials, nanocomposites, particles analysis;
- interdisciplinary techniques.
For further information, please visit:
Remarks: A call for posters is open until 30 April 2007
Data Source Provider: Nanotec IT
Document Reference: Based on an event announcement
Subject Index: Materials Technology; Measurement Methods; Other Technology