Objective The aim of this project is the development of VLSI Testers SITEST 764 and SITEST 780. It is planned to develop other VLSI Testers based on similar technology in order to be able to offer to the customers a whole family of VLSI Testers. The two VLSI Testers SITEST 764 and 780 differ quite considerably in their performance. The essential features of VLSI Testers are the bit repetition rate with the related system accuracy and the maximum number of Pins per test head. The corresponding figures are 12 MHz and 64 Pins for the SITEST 764 and 50 MHz and 256 Pins for the SITEST 780. The users will receive prototype equipment of VLSI Tester 764 in mid 1984 and prototype equipment of VLSI 780 in mid 1985. The users' experience, obtained through the use of the equipment for testing advanced VLSI circuits, will be documented (reports). It is expected that after completion of the project the testers will be fully commercialized. Programme(s) PRE-MELREG C - Community actions (EEC) in the field of microelectronic technology, 1982-1985 Topic(s) Data not available Call for proposal Data not available Funding Scheme Data not available Coordinator SIEMENS AG EU contribution No data Address Östliche Rheinbrückenstraße 50 7500 KARLSRUHE Germany See on map Total cost No data Participants (3) Sort alphabetically Sort by EU Contribution Expand all Collapse all EFFICS SA France EU contribution No data Address See on map Total cost No data Grundig AG Germany EU contribution No data Address Dudenstraße 45 68167 Mannheim See on map Total cost No data Italtel Società Italiana Telecomunicazioni SpA Italy EU contribution No data Address Castelletto di Settimo Milanese 20019 Milano See on map Total cost No data
