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Board and SoC Test Instrumentation for Ageing and No Failure Found

Opis projektu


Nanoelectronics

Today, an average family spends annually over 50 Euros on No-Failure-Found (NFF) investigations - a known problem of an unknown origin. Tomorrow, the electronic engine control system in a car will be dying after two-three years of operation due to CMOS ageing. Actions are urgently needed!A group of European experts will unite their forces in BASTION to fight against ageing and NFF issues. The project will investigate currently unknown defects, uncertain fault coverage and unclassified field returns. A new defect universe will be assembled and faults will be classified into comprehensive classes. BASTION will study the mechanisms of ageing and improve the longevity of electronic products. Embedded instrumentation and the IEEE P1687 standard will be applied to develop an ultra-low-latency, scalable error detection and localization infrastructure as well as to integrate all heterogeneous technologies into a homogeneous system.The project will complete in three years, at only a negligible fraction of costs wasted by society on NFF annually.

Zaproszenie do składania wniosków

FP7-ICT-2013-11
Zobacz inne projekty w ramach tego zaproszenia

Koordynator

OÜ TESTONICA LAB
Wkład UE
€ 480 141,00
Adres
AKADEEMIA TEE 15A
12618 Tallinn
Estonia

Zobacz na mapie

Region
Eesti Eesti Põhja-Eesti
Rodzaj działalności
Private for-profit entities (excluding Higher or Secondary Education Establishments)
Kontakt administracyjny
Artur Jutman (Dr.)
Linki
Koszt całkowity
Brak danych

Uczestnicy (7)