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Contenido archivado el 2024-04-15

NON-DESTRUCTIVE SURFACE AND THIN FILM ANALYSIS BY LOW-ENERGY EMISSION SPECTROSCOPY

Objetivo


Low energy electron induced X-ray spectrocopy (LEEIXS) has been established as a qualitative method for surface film analysis in the nanometre range. At a more specific level, the work has resulted in the mutually beneficial exchange of X-ray spectroscopic experience, computer software for data analysis and analytical equipment.

Tema(s)

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Convocatoria de propuestas

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Régimen de financiación

CSC - Cost-sharing contracts

Coordinador

Queen Mary and Westfield College
Aportación de la UE
Sin datos
Dirección
Mile End Road
E1 4NS London
Reino Unido

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Coste total
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Participantes (1)