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Horizon 2020 project information and now also report summaries are available on CORDIS. All H2020 projects can be downloaded from the EU Open Data Portal .

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ID: MTR176
The objective of the project is to produce a photomask linewidth calibration standard covering the dimensional range 0.20 um up to 50 um, with a 95% confidence level uncertainty in the calibration of lines of at least +/- 0.02 um in the 0.2 um up to 10 um range, and of at le...
Programme: FP2-BCR 4
Record Number: 24431
Last updated on: 1995-03-15
ID: MTR109
The objectives of the project are the development, manufacture, full characterization and testing of SiO2 on Si specimens with three layer thicknesses with nominal values of 10, 50 and 120 nm, respectively. This should then, if successful, lead to the delivery of SiO2 for th...
Programme: FP2-BCR 4
Record Number: 24421
Last updated on: 1995-03-15
ID: MTR121
Two flow rigs, one for water and one for air, were circulated in an intercomparison of laser doppler and hot wire anemometry measurements. Complex systematic differences in results were observed for not only the two types of measuring system but also between instruments of d...
Programme: FP2-BCR 4
Record Number: 24463
Last updated on: 1995-03-15
ID: MTR103
Worldwide over 1012 soldered joints are made annually in the production of electronics for the consumer, industrial and military markets. About 1/3 of these are made within the Community. With increasing manufacturing automation the cost of identifying and replacing a defect...
Programme: FP2-BCR 4
Record Number: 24367
Last updated on: 1995-03-15
ID: RM189
The oxygen content of silicon is an important parameter for the manufacturing of integrated circuits and other electronic devices. The measurements are based on infrared absorption spectrometry. Results of infrared absorption measurement often differ by several percent betwe...
Programme: FP2-BCR 4
Record Number: 24337
Last updated on: 1995-03-15
ID: MTR189
Optical lithography in integrated circuit fabrication presently consists of about 20 successive mask steps. Up to now no calibrated two dimensional photomask position standard (2DPPS) traceable to the SI unit of length exists; metrological institutes can supply only one dime...
Programme: FP2-BCR 4
Record Number: 24439
Last updated on: 1995-03-15
ID: RM253
Creep is the continuous plastic deformation of a material under stress, generally at high temperatures, which will eventually lead to a component or structure becoming so weakened that it is unable to support the applied load. In view of the slowness of the process creep tes...
Programme: FP2-BCR 4
Record Number: 24411
Last updated on: 1995-03-15
ID: MTR117
Type K (nickel-chromium/nickel-aluminium) thermocouples are widely used in industry for measuring temperature in the range 200 C to 1000 C but drift by more than 5 C in the range 300 C to 500 C due to metallurgical ordering and disordering (the hysteresis effect). Nickel-chr...
Programme: FP2-BCR 4
Record Number: 24444
Last updated on: 1995-03-15
ID: MTR140
As it is not possible in the present state of the art to determine the total emissivity in a practical way in routine laboratories, the problem of importance for industry is to know the correlation between hemispherical emissivity and normal emissivity. Industry actually det...
Programme: FP2-BCR 4
Record Number: 24385
Last updated on: 1995-03-15
ID: MTR114
Multiple wavelength interferometry is a technique used in mechanical metrology laboratories throughout the world for the absolute measurement of length of gauge blocks and length bars. Current instruments use cadmium and mercury gas discharge lamps to provide the measuremen...
Programme: FP2-BCR 4
Record Number: 24448
Last updated on: 1995-03-15
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List retrieved on: 2018-01-22
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