The JET high resolution bent crystal spectrometer
In this paper is described the bent crystal spectrometer of the Johann type built for the JET tokomak. This high resolution instrument is characterised by a very long focal length (25 m) allowing the crystal and the position sensitive detector to be placed outside the JET torus hall, to keep the background radiation induced noise to an acceptable level. By means of the shape analysis of X-ray lines emitted by medium Z, highly ionized impurities present in the plasma of the ion temperature, can be evaluated. Information about plasma parameters such as the electron temperature, the impurity ionization equilibrium and concentration, and the plasma toroidal velocity can be obtained by the analysis of different lines present in the spectra and of their wavelengths. Examples of the results obtained during the first year of operation of this instrument are illustrated.
Bibliographic Reference: Report: RT/FUS/87/38 EN (1987)
Availability: Available from Servizio Studi e Documentazione, ENEA, Centro Ricerche Energia Frascati, C.P. 65-00044 Frascati, Roma (IT)
Record Number: 198910106 / Last updated on: 1994-12-01
Original language: en
Available languages: en