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Abstract

The properties of synchrotron radiation make it a unique tool for the X-ray analysis of samples which, for reasons of size, shape or concentration, are unsuitable for analysis using standard X-ray sources. Two important techniques are examined which are suited to synchrotron radiation sources - namely Extended X-ray Absorption Fine Structure (EXAFS) and Glancing Angle X-ray Analysis. EXAFS, together with X-ray Absorption Near Edge Structure (XANES), furnishes information about the local environment around particular atoms in a material, and is particularly useful in determining how such atoms are incorporated in a host structure when their concentration is too low for standard X-ray techniques. Glancing Angle X-ray Analysis is used to investigate the surface structure of materials (down to about 50 Angstroms), and for example is useful for studying leached or slightly corroded surfaces and thin modified or deposited layers. The glancing angle geometry may be employed for both diffraction studies or for EXAFS/XANES analysis (in several different modes). Both techniques are described with examples of their application.

Additional information

Authors: GIBSON P N, JRC Ispra Estab. (IT);BOEUF A, JRC Ispra Estab. (IT);GIARDINA M, JRC Ispra Estab. (IT)
Bibliographic Reference: Paper presented: EC-Yugoslavian Colloqium on Advanced Materials, Sarajevo (YU), Sept. 12-14, 1988
Availability: Available from (1) as Paper EN 34248 ORA
Record Number: 198910815 / Last updated on: 1994-12-01
Category: PUBLICATION
Original language: en
Available languages: en