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Authors: ANGER K, SIEMENS AG, BERLIN (D);KRAHL D, SIEMENS AG, BERLIN (D);THON F SIEMENS AG, BERLIN (D), SIEMENS AG, BERLIN (D)
Bibliographic Reference: INT. COLLOQUIUM ON RADIOLOGICAL PROTECTION PROBLEMS ASSOCIATED WITH PARASITIC X-RAY EMISSION FROM ELECTRONIC PRODUCTS, TOULOUSE (FRANCE), NOV. 3-6, -1970 PROC. : PP. 31-40 - EUR 4660 D-E-F (1971)
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