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Abstract

Soft carbonized layers prepared in a glow discharge, with a hydrogen concentration of H:C about 4/3, are exposed to helium ion bombardment at energies between 0.3 and 2.6 MeV. A strong ion-induced depletion of up to 3 X 1.0 E3 H atoms per incident 4He(+) ion is observed by means of high-energy ion beam analysis. The hydrogen release is shown to be a local process, with the electronic energy deposition as the main responsible mechanism. The results are successfully compared to a model which takes into account local bond breaking and retrapping and the local formation of hydrogen molecules.

Additional information

Authors: BOUTARD D, Max-Planck-Institut für Plasmaphysik, D-8046 Garching bei München (DE);SCHERZER B M U, Max-Planck-Institut für Plasmaphysik, D-8046 Garching bei München (DE);MÖLLER W, Max-Planck-Institut für Plasmaphysik, D-8046 Garching bei München (DE);MOLLER W, Max-Planck-Institut fur Plasmaphysik, D-8046 Garching bei Munchen (DE)
Bibliographic Reference: Article: Journal of Applied Physics, Vol. 65 (1989), No. 10, pp. 3833-3837
Record Number: 198911098 / Last updated on: 1994-12-01
Category: PUBLICATION
Original language: en
Available languages: en