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Authors: AMENDOLA A, JRC-ISPRA/I, UNIV. OF LOUVAIN/B, SIGEN, MILAN/I, UNIV. OF NAPLES/I;POUCET A, JRC-ISPRA/I, UNIV. OF LOUVAIN/B, SIGEN, MILAN/I, UNIV. OF NAPLES/I;CONTINI S, JRC-ISPRA/I, UNIV. OF LOUVAIN/B, SIGEN, MILAN/I, UNIV. OF NAPLES/I;SQUELLATI G, JRC-ISPRA/I, UNIV. OF LOUVAIN/B, SIGEN, MILAN/I, UNIV. OF NAPLES/I;MONGELUZZO R JRC-ISPRA/I, UNIV. OF LOUVAIN/B, SIGEN, MILAN/I, UNIV. OF NAPLES/I, JRC-ISPRA/I, UNIV. OF LOUVAIN/B, SIGEN, MILAN/I, UNIV. OF NAPLES/I
Bibliographic Reference: EUROCON 1982: RELIABILITY IN ELECTRICAL AND ELECTRONIC COMPONENTS AND SYSTEMS, COPENHAGEN (DK), JUNE 14-18, 1982.
Availability: Can be ordered online
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