RUTHERFORD BACKSCATTERING ANALYSIS OF LEACHED AND ION BOMBARDED GLASSES
Rutherford backscattering of He-ions is introduced as a fast and nondestructive technique to analyze the composition of layers that form on different waste glasses. The glasses studied were the products VG 98/12 and GP 98/12 developed by INE, KfK Karlsruhe and SM 58 LW 11 designed to solidify the low enriched waste concentrate, LEWC of the Eurochemic, Mol, Belgium. The best mass resolution was obtained with 2.8 MeV He-ion beams. Rutherford-backscattering, RBS, is thus shown to yield quantitative information on layer composition for elements heavier than oxygen and layer thickness up to about 2 mum. Layer thicknesses can also be estimated; the results compare favorably with those deduced optically from interference colors. The glasses were studied in as-received condition, following leaching, following ion bombardment, and following ion bombardment and leaching. For ion bombardment, beams of Pb-ions and Xe-ions at doses of 5.10**14 and 5.10**15 ions/cm**2 were used. The composition of the layers was deduced from the RBS spectra. Neither thickness of the layers nor composition were strongly altered by the ion bombardment procedure.
Bibliographic Reference: EUROPEAN WORKSHOP ON PHYSICAL TECHNIQUES FOR STUDIES OF SURFACE AND SUBSURFACE LAYERS OF GLASSES, ISPRA (ITALY), APRIL 12-G13, 1983 WRITE TO CEC LUXEMBOURG, DG XIII/A2, POB 1907 MENTIONING PAPER E 31313 ORA
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Record Number: 1989122066600 / Last updated on: 1987-01-01
Available languages: en