HIGHLY SENSITIVE CRYSTAL X-RAY SPECTROMETRY FOR TOKAMAK PLASMA
A detailed study of the characteristics of a highly sensitive, plane graphite crystal De Broglie spectrometer is developed. Preliminary experimental results are reported. Soft X-ray diagnostics, based on simulation of heavy impurities by argon in tokamaks, are proposed.
Bibliographic Reference: WRITE TO ENEA - SERVIZIO STUDI E DOCUMENTAZIONE CENTRO RICERCHE ENGERGIA FRASCATI, C.P. 65, 00044 FRASCATI, ROMA (ITALY) MENTIONING REPORT 82.62, 1982
Record Number: 1989122078800 / Last updated on: 1987-01-01
Available languages: en