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Abstract

The soft x-ray absorber foil technique for electron temperature measurements is considered. The idea is introduced to compare the signals of a surface barrier diode and an x-ray sensitive photodiode rather than those of two identical detectors. The contrasting characteristics of the two detector types gives rise to an improvement of the temperature resolution by a factor 2 (at 0.4 keV) to 10 (at 10 keV).

Additional information

Authors: LOPES CARDOZO N J FOM-INSTITUUT VOOR PLASMAFYSICA RIJNHUIZEN, NIEUWEGEIN (THE NETHERLANDS), FOM-INSTITUUT VOOR PLASMAFYSICA RIJNHUIZEN, NIEUWEGEIN (THE NETHERLANDS)
Bibliographic Reference: REV. SCI. INSTRUM., VOL. 55 (1984), NO. 7, PP. 1077-1079.
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