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Abstract

Surface analysis has been conducted on samples leached in a Soxhlet apparatus at 100 degrees C in presence and in absence of air. The XPS and RBS techniques were applied to analyse the content of the silicon, iron and uranium while the nuclear reaction method was utilized to analyse the hydrogen content. The anoxic environment favours the release of iron while decreasing the dissolution of uranium. Hydrogen content is always higher in samples leached in presence of air. Silicon depletion is evident in all cases. The diffusion process seems to regulate the growth of the layer on the glass surface. After long leaching time a detachment, at least partial, of this layer is observed.

Additional information

Authors: MANARA A, JRC ISPRA ESTAB. (ITALY);PADUA UNIVERSITY (ITALY);LANZA F, JRC ISPRA ESTAB. (ITALY);PADUA UNIVERSITY (ITALY);CECCONE G, JRC ISPRA ESTAB. (ITALY);PADUA UNIVERSITY (ITALY);DELLA MEA G, JRC ISPRA ESTAB. (ITALY);PADUA UNIVERSITY (ITALY);SALVAGNO G JRC ISPRA ESTAB. (ITALY), JRC ISPRA ESTAB. (ITALY);PADUA UNIVERSITY (ITALY);PADUA UNIVERSITY (ITALY), JRC ISPRA ESTAB. (ITALY);PADUA UNIVERSITY (ITALY)
Bibliographic Reference: 1984 ANNUAL MEETING OF THE MATERIALS RESEARCH SOCIETY, BOSTON (USA), NOV. 26-30, 1984 WRITE TO CEC LUXEMBOURG, DG XIII/A2, POB 1907 MENTIONING PAPER E 31831 ORA
Availability: Can be ordered online
Record Number: 1989123027000 / Last updated on: 1987-01-01
Category: PUBLICATION
Available languages: en
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