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Abstract

A technique is described for the direct indexing of two-beam electron diffraction conditions in the electron microscope. The technique involves the calculation of angles between the g-vector to be indexed and a set of three known reference vectors. The experimentally obtained angles may be compared with calculated interplanar angles, leading to an unambiguous indexing of the two-beam situation. In-situ indexing is possible when the microscope is equipped with a device for the direct measurement of diffraction spot positions.

Additional information

Authors: TAMBUYSER P JRC PETTEN ESTAB. (THE NETHERLANDS), JRC PETTEN ESTAB. (THE NETHERLANDS)
Bibliographic Reference: METALLOGRAPHY, VOL. 18 (1985), PP. 41-49
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