DETERMINATION OF THE RADIATIVE PROPERTIES OF SURFACES USING REFLECTANCE TECHNIQUES
For thermal radiation there is a lack of collecting devices because the experimental difficulties are considerable. These difficulties arise from the fact that thermal radiation has a much lower intensity than solar radiation. This report describes two measuring devices which have been constructed to determine the reflectance properties of rough surfaces in the thermal spectrum; an integrating sphere and an integrating ellipsoidal mirror. Both installations use a conventional infrared spectrophotometer. With this equipment the spectral reflectance of rough surfaces in the wavelength range 2.5- 40 mum) can be determined. The use of these installations enables one to calculate the emittance properties of a sample and to perform optimisation studies on spectral selective layers.
Bibliographic Reference: EUR 9520 EN (1984) MF, 233 P., BFR 360, BLOW-UP COPY BFR 1165, EUROFFICE, LUXEMBOURG, POB 1003
Availability: Can be ordered online
Record Number: 1989123085700 / Last updated on: 1987-01-01
Available languages: en