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Abstract

Since the experimental technique of particle induced x-ray emission (PIXE) analysis has been developed such that accuracies of 5% to 10% can be reached in spite of a lack of appropriate reference materials, the computer processing of spectral data, both in terms of evaluation algorithms used and data bases involved, is believed to be the principal limiting factor of accuracy in PIXE analysis. The influence of varying mass ratios of "interfering" elements on the accuracy of PIXE determinations is investigated, using systems such as BaC1-2 with Ti added to it at the same mass, one tenth of the Ba mass and one hundredth of it. The samples are produced by vacuum evaporation of thin films, with the mass thicknesses determined gravimetrically before and after the evaporation by use of a UHV microbalance.

Additional information

Authors: DOBMA W, JRC GEEL ESTAB. (BELGIUM);ESCHBACH H L, JRC GEEL ESTAB. (BELGIUM);LOUWERIX E, JRC GEEL ESTAB. (BELGIUM);RIETVELD P, JRC GEEL ESTAB. (BELGIUM);WAETJEN U JRC GEEL ESTAB. (BELGIUM), JRC GEEL ESTAB. (BELGIUM)
Bibliographic Reference: XXIV COLLOQUIUM SPECTROSCOPICUM INTERNATIONALE, GARMISCH-PARTENKIRCHEN (GERMANY), SEPT. 15-21, 1985 WRITE TO CEC LUXEMBOURG, DG XIII/A2, POB 1907 MENTIONING PAPER E 32159 ORA
Availability: Can be ordered online
Record Number: 1989123086500 / Last updated on: 1987-01-01
Category: PUBLICATION
Available languages: en