SOFT X-RAY ELECTRON TEMPERATURE MEASUREMENTS ON TORTUR
After recapitulating the absorber foil technique, and providing samples of raw data, the author discusses the processing of the signals and comparison of the soft x-ray temperature measurements with laser shattering data and gives a discussion of various error sources in the evaluation of T-e, and the effect of the impurity distribution on the SXR emissivity profile. From high SXR flux and low electron temperatures as inferred from the foil method, a number of processes are assumed to take place. The SXR measurements point to an oxygen contamination of pronounced radial gradient; an estimation whether diffusion processes are slow enough for the oxygen blanket to outlive the plasma, are undertaken. Furthermore, the typical ionization times of the various ionization states of oxygen are given in order to check whether the retardation and enhancement of the SXR flux are plausible. Results of later experiment on TORTUR are briefly mentioned, experimental approaches for further investigations into the subject sketched.
Bibliographic Reference: WRITE TO FOM-INSTITUUT VOOR PLASMAFYSICA "RIJNHUIZEN", P.O. BOX 1207, 3430 BE NIEUWEGEIN (THE NETHERLANDS) MENTIONING RIJNHUIZEN REPORT 84-151, 1984
Record Number: 1989123105300 / Last updated on: 1987-01-01
Available languages: en