BULK AND SURFACE TRACE ANALYSIS OF RHENIUM FILAMENTS BY SPARK SOURCE AND SECONDARY ION MASS SPECTROMETRY. THE EFFECT OF THERMAL ANNEALING IN VACUUM
It was attempted to purify rhenium filaments, used in thermal ionization mass spectrometers, by a thermal treatment in vacuum. Surface contaminants could entirely be removed by heating the filaments at 1600 degrees C, as was shown by secondary ion mass spectrometry. Spark source mass spectrometric analysis showed that the bulk impurity level remained essentially constant after such treatment. Higher temperature runs (1700-2200 degrees C) however are effective in removing bulk impurities.
Bibliographic Reference: J. TRACE AND MICROPROBE TECHNIQUES, VOL. 2 (1984), NO. 2 PP. 119-138
Record Number: 1989124012700 / Last updated on: 1987-01-01
Available languages: en