THE USE OF A JEOL-SM-35C SCANNING ELECTRON MICROSCOPE TO EXAMINE IRRADIATED MATERIAL
The installation has been devised to examine fuels (U,Pu)O-2 or irradiated (U,Pu)C. The samples studied are usually obtained by fractography and can lead to a contamination alpha, gamma of the microscope column. Considering the imposed constraints by the local security regulations it appeared to us that the maximum operating flexibility could only be ensured by completely encasing the microscope in an air tight glove box alpha. In its lower part 4 consoles at right angle hold the microscope. In its middle, a table separates the column and the microscope chamber from the accessories and the electrical supply. In its upper part a rolling bridge eases the dismantling operation of the column. 15 cm thick cast iron walls surround the glove box. Only the front face is made of a Pb wall 15 cm thick equipped with two watch portholes. Modifications of the microscope are mainly limited to the screening of the collector and of the scintillator and to the telecommand of the goniometric table movements by means of micromotors, which moves are controlled by potentiometric transducers. The microscope has been in use since 1982 without major problems. The morphological variations subjected by the irradiated mixed oxide either at constant power or at transitional speed and the repartition of the porosity in the irradiated mixed carbide are, at the moment, at the centre of the studies.
Bibliographic Reference: 10TH INTERNATIONAL CONGRESS ON X-RAY OPTICS AND MICROANALYSIS, TOULOUSE (FRANCE), SEPT. 5-9, 1983 WRITE TO CEC LUXEMBOURG, DG XIII/A2, POB 1907 MENTIONING PAPER F 31036 ORA
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Record Number: 1989124075100 / Last updated on: 1987-01-01
Available languages: fr