EXPERIMENTAL DETERMINATION OF THE ICRF POWER DEPOSITION PROFILE AND COMPARISON WITH RAY TRACING CALCULATIONS
ICRH power deposition profiles determined by (a) Ray tracing, (b) Change of slopes of a sawtooth of an ECE signal and (c) Modulation experiments analyzed by correlation technique and Boxcar technique, have been compared for a JET deuterium plasma in the minority heating scheme. The results of power densities obtained by different methods are found to be in good agreements. The RF power deposition profiles are found to be well localized and are relatively narrow with respect to the size of the plasma. When the modulation frequency is increased from 5 to 25 Hz, the plasma temperature response goes down and the signal to noise ratio is worse. The presence of the strong sawteeth complicates the data analysis. The power deposition profile presented have been obtained from the data when the modulation frequency was 5 Hz. These results suffer from the effect of energy diffusion which broadens the deposition profile. The effect of sawteething, equipartition etc have been ignored.
Bibliographic Reference: 13TH EUROPEAN CONFERENCE ON CONTROLLED FUSION AND PLASMA HEATING, SCHLIERSEE (GERMANY), APRIL 14-18, 1986 PP. 41-44 WRITE TO THE PUBLICATIONS OFFICER, JET JOINT UNDERTAKING, ABINGDON, OXON, OX14 3EA (UK) MENTIONING REPORT JET-P(86)15, 1986
Record Number: 1989125008800 / Last updated on: 1987-01-01
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