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Abstract

The plasma response to a modulation of the RF power, in LHEH scheme has been calculated, by means of a very simple model. On this basis it seems possible to get information about the energy deposition profile by modulating the input RF power, since both the modulation time and the temperature oscillation amplitudes result to be detectable through soft X-ray diagnostic.

Additional information

Authors: BARBATO E, ENEA, CENTRO RICERCHE ENERGIA FRASCATI (ITALY);GIANNELLA R ENEA, CENTRO RICERCHE ENERGIA FRASCATI (ITALY), ENEA, CENTRO RICERCHE ENERGIA FRASCATI (ITALY)
Bibliographic Reference: 12TH EUROPEAN CONFERENCE ON CONTROLLED FUSION AND PLASMA PHYSICS, BUDAPEST (HUNGARY), SEPT. 2-6, 1985 PP. 51-54 WRITE TO SERVIZIO STUDI E DOCUMENTAZIONE - ENEA, CENTRO RICERCHE ENERGIA FRASCATI, C.P. 65 - 00044 FRASCATI, ROMA (ITALY) MENTIONING REPORT RT/
Record Number: 1989125049100 / Last updated on: 1987-07-01
Category: PUBLICATION
Available languages: en