Community Research and Development Information Service - CORDIS

Abstract

Quantitative thin foil X-ray microanalysis requires precise knowledge of the proportionality constants (k factors) relating the ratios of characteristic X-ray intensities to elemental concentrations. Published tables of k factors have been compiled with data taken mainly from mineral and binary alloy standards. In instances where substantial spectral peak overlap or significant absorption and/or fluorescence effects occur, improved analytical accuracy may be achieved by employing k factors derived from multi-element standards of similar composition to the specimen itself. Absorption and fluorescence become especially problematical with higher accelerating voltages, as a consequence of the increase in the maximum thickness transparent to electrons. In order to determine appropriate values for microanalysis in stainless steel specimens at 200 kV, Cr-Ni-Fe and Cr- Mn-Fe foils of known compositions were used as standards. Effective k factors were plotted as functions of oil thickness over the range 50-2000 nm. The limits of validity of the thin foil approximation (i.e. no absorption or fluorescence corrections necessary) were hence estimated in each case. Under thin foil conditions the mean k factors for K-alpha lines were: k-CrFe = 0.90 +- 0.04, k-NiFe = 1.05 +- 0.05.

Additional information

Authors: RICKERBY D G JRC - ISPRA ESTAB. (ITALY), JRC - ISPRA ESTAB. (ITALY)
Bibliographic Reference: EMAG '87 AND WORKSHOP ON ANALYTICAL ELECTRON MICROSCOPY, MANCHESTER (UK), SEPT. 6-11, 1987 WRITE TO CEC LUXEMBOURG, DG XIII/A2, POB 1907 MENTIONING PAPER E 33562 ORA
Availability: Can be ordered online
Record Number: 1989126039901 / Last updated on: 1989-01-01
Category: PUBLICATION
Available languages: en
Follow us on: RSS Facebook Twitter YouTube Managed by the EU Publications Office Top