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Abstract

A review of the characteristics of X-ray monochromators used at different synchrotron radiation sources is presented and the theoretical instruments necessary to calculate the diffraction properties of both perfect and curved crystals are discussed. After a description of the source properties, the reflection of X-rays by optical surfaces and the optics of curved crystals monochromators are considered. Then, the graphic methods used for synchrotron radiation X-ray optics and the optical systems adopted in different experimental apparatuses are reviewed. Afterwards, the basic concepts of dynamic theory of X-ray diffraction by perfect crystals and the modifications induced in the diffraction properties by bending the crystals are discussed. Finally, a physical model useful to predict the main diffraction characteristics of bent monochromators is described and used for the interpretation of some experimental results.

Additional information

Authors: CACIUFFO R, UNIVERSITA DI ANCONA (ITALY);JRC - ISPRA ESTAB. (ITALY);MELONE S, UNIVERSITA DI ANCONA (ITALY);JRC - ISPRA ESTAB. (ITALY);RUSTICHELLI F, UNIVERSITA DI ANCONA (ITALY);JRC - ISPRA ESTAB. (ITALY);BOEUF A UNIVERSITA DI ANCONA (ITALY), UNIVERSITA DI ANCONA (ITALY);JRC - ISPRA ESTAB. (ITALY);JRC - ISPRA ESTAB. (ITALY), UNIVERSITA DI ANCONA (ITALY);JRC - ISPRA ESTAB. (ITALY)
Bibliographic Reference: PHYSICS REPORTS (REVIEW SECTION OF PHYSICS LETTERS), VOL. 152 (1987), NO. 1, PP. 1-71
Record Number: 1989126052100 / Last updated on: 1989-03-01
Category: PUBLICATION
Available languages: en