HIGH RESOLUTION X-RAY SPECTROSCOPY AT JET
A high resolution X-ray crystal spectrometer was installed at JET in 1986, whose main task is the measurement of the ion temperature and rotation velocity from Doppler broadening and shifts. Stringent operation requirements considerably conditioned its versatility as a survey instrument or a tool for fundamental research. The unique conditions of the JET plasmas, however, allowed observations in high resolution and identification of lines from the highest ionization stages (B-like to H-like) of nickel in the vicinity of the resonance transitions of the one- and two-electron systems of this element. These spectra and their relevance to the study of JET physics are briefly presented. The comparison with atomic physics theoretical computations of He-like and H-like ions spectra observed at JET is also presented. The most intense among these lines could regularly be monitored with adequate time resolution to produce an extensive data base. The experimental spectra are simulated by integrating the theoretical ones along the spectrograph line-of-sight across the plasma. Ion temperature as well as rotation velocity measurements in ohmic and additionally heated plasmas are discussed and their relationship with other physical quantities and operational parameters are reviewed. Details of the spectrometer design, its layout and its operational capabilities are also given.
Bibliographic Reference: REPORT JET-P(87)53, 1987, AVAILABILITY: JET, ABINGDON, UK
Record Number: 1989126084600 / Last updated on: 1989-05-01
Available languages: en