SOFT X-RAY EMISSION DURING APPLICATION OF LOWER HYBRID WAVES ON JET
In this report, we study the local variation of the integrated X-ray emission between various photon energy ranges corresponding to a Si(Li) diode, when fast electrons are induced by lower hybrid waves. Carbon, oxygen, iron and nickel impurities are considered. The modification of the charge equilibrium of the plasma by fast electrons within the corona model is investigated, and the consequences on the radiated power discussed. Corrections due to multi-ionization and impurity transport are evaluated. The difference of the emitted X- ray power per ion between a maxwellian and a suprathermal distribution can yield also to a significant variation of the integrated X-ray emission. This effect is evaluated for various situations of suprathermal distributions and electronic temperatures. Some simple accommodations of existing diagnostic in JET are then proposed, in order to diagnose the fast electron tail.
Bibliographic Reference: REPORT EUR-CEA-FC-1351-EN-88, AVAILABILITY: CEA/CEN, CADARACHE, F
Availability: Can be ordered online
Record Number: 1989126097300 / Last updated on: 1989-05-01
Available languages: en