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Abstract

The measurement of ion temperatures from the Doppler broadening of spectral lines is discussed. Calculations are used to show that the shape of the instrument function of the spectrometer can have a significant effect on the measured value, even when the broadening is large (sim10x) compared with the half-width of the instrument function. The discussion is illustrated by the topical example for measurements made using an XUV grating spectrometer.

Additional information

Authors: LAWSON K?D JET JOINT UNDERTAKING, ABINGDON, UK PEACOCK N?J CULHAM LABORATORY, ABINGDON , JET JOINT UNDERTAKING, ABINGDON, UK;CULHAM LABORATORY, ABINGDON
Bibliographic Reference: REPORT JET-P(88)17, 1988, AVAILABILITY: JET, ABINGDON, UK
Record Number: 1989126098600 / Last updated on: 1989-05-01
Category: PUBLICATION
Available languages: en