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Abstract

Fe films of 700-1700 AA were evaporated on pyrolytic graphite surfaces with both edge and base orientations, and bombarded with D ions at energies from 2 to 13 keV at fluences of 10"19" D/cm2. The different ion energies and Fe film thicknesses allow different defect distributions in the graphite substrate of the samples. The Fe sputtering yield of the samples was measured directly by means of laser-induced fluorescence at temperatures ranging from room temperature to 900 K. The depth distribution of the components during mixing is obtained by means of Rutherford backscattering spectroscopy. At 800 K, a drastic reduction of the Fe sputtering yield is observed if energetic ions can reach the graphite substrate. C segregates on top of the Fe layers for D ion ranges larger than the Fe layer thickness. The thickness of the segregated C layers depends on the graphite orientation. For 13 keV D bombardment of 700 AA Fe samples, for example, it is about 100 AA for base graphite and about 1000 AA for edge graphite.

Additional information

Authors: SANTANIELLO A, IPP, D;BOHDANSKY J, IPP, D;ROTH J IPP, D, IPP, D
Bibliographic Reference: APPLIED PHYSICS LETTERS, VOL. 52, NO. 5, PP 356-358, 1988
Record Number: 1989126099700 / Last updated on: 1989-05-01
Category: PUBLICATION
Available languages: en
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