Community Research and Development Information Service - CORDIS

Abstract

IN THIS REPORT A DETAILED DESCRIPTION OF SEVERAL METHODS WHICH HAVE BEEN APPLIED FOR THE CHARACTERISATION OF AMORPHOUS HYDROGENATED SILICON IS GIVEN. THESE METHODS ARE : OPTICAL AND INFRARED SPECTROSCOPY, ELECTRON SPIN RESONANCE, DARK AND PHOTO CONDUCTIVITY MEASUREMENTS, AND STATIONARY AND TRANSIENT IMPEDANCE SPECTROSCOPY. THE INFORMATION AND PARAMETERS WHICH CAN BE OBTAINED BY THE APPLICATION OF THE DESCRIBED METHODS, ARE REVIEWED. THE MEASUREMENT TECHNIQUE OF EACH METHOD AND ITS IMPLEMENTATION IN A TEST LABORATORY OF THE JOINT RESEARCH CENTRE IS DESCRIBED. COMPUTER PROGRAM ROUTINES HAVE BEEN DEVELOPED TO CONTROL AND EVALUATE MEASUREMENTS.

Additional information

Authors: GISSLER W, JRC-ISPRA;HAUPT J JRC-ISPRA, JRC-ISPRA
Bibliographic Reference: EUR 11623 EN (1988) MF, PP 38, ECU 4.00, BLOW-UP COPY, ECU 5.00, AVAILABILITY: EUROFFICE, LUXEMBOURG, BP 1003, GDL
Availability: Can be ordered online
Record Number: 1989126208300 / Last updated on: 1989-04-01
Category: PUBLICATION
Available languages: en