A GENERAL METHOD FOR MEASURING THE SCATTERING MATRICES OF N-PORT SYSTEMS
Arising from the need to test the multijunctions that will build up the JET lower hybrid antenna, a general model to measure scattering matrices of microwave devices has been developed. The model allows for devices with any number of ports and for the use of adaptors between the measuring system and the device under test. Its accuracy can be as good as 1% for waveguide components.
Bibliographic Reference: REPORT: JET-R(89)11 EN (1989) 17 PP. AVAILABLE FROM THE PUBLICATIONS OFFICER, JET JOINT UNDERTAKING, ABINGDON, OXON. OX14 3EA (GB)
Record Number: 1989128078000 / Last updated on: 1990-10-01
Available languages: en