Community Research and Development Information Service - CORDIS

Abstract

Hoesch Stahl AG has developed a new profile gauge to measure the strip profile over the width with the combination of the following conditions: - high resolution in the thickness - high local resolution over the width of the strip - short measuring time - large thickness range - high local resolution of the edges of the strip. The main components of this profile gauge are a modified industrial X-ray equipment with an energy of 320 keV, newly developed X-ray detectors with high resolution and dynamics as well as an autozeroing system for the detectors and a special concept for the gauge itself. This concept enables measurement of the profile over the whole width including the edges, with a high local resolution, within a short measuring time.

Additional information

Authors: KOPINECK H J, HOESCH STAHL AG, DORTMUND (DE);BOETTCHER W, HOESCH STAHL AG, DORTMUND (DE);OTTEN H HOESCH STAHL AG, DORTMUND (DE), HOESCH STAHL AG, DORTMUND (DE)
Bibliographic Reference: EUR 12492 DE (1990) 77 PP., MF, ECU 4, BLOW-UP COPY ECU 10 THE OFFICE FOR OFFICIAL PUBLICATIONS OF THE EUROPEAN COMMUNITIES, L-2985 LUXEMBOURG
Availability: Can be ordered online
Record Number: 1989128095700 / Last updated on: 1991-05-15
Category: PUBLICATION
Original language: DE
Available languages: de