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Abstract

Electrons with kinetic energies below 30eV are very sensitive to the structure of the surface of single crystals. The angle of incidence of such electrons can be determined simply by measuring the sample current from the electron gun. Changes in the reflectivity produce maxima and minima in the scans, which are a consequence of the band structure. The sensitivity of the method is enhanced by measurement of the first derivative of the sample current with respect to the electron energy. The main advantage of the described procedure is the ease and speed of the measurements.

Additional information

Authors: SCHNEIDER R, Max-Planck-Institut für Plasmaphysik, Garching bei München (DE);DÜRR H, Max-Planck-Institut für Plasmaphysik, Garching bei München (DE);FAUSTER T, Max-Planck-Institut für Plasmaphysik, Garching bei München (DE);DURR H, Max-Planck-Institut fur Plasmaphysik, Garching bei Munchen (DE);DOSE V,
Bibliographic Reference: Article: Journal of Vacuum Science and Technology A, Vol. 8 (1990) No. 4, pp. 3363-3364
Record Number: 199011411 / Last updated on: 1994-12-02
Category: PUBLICATION
Original language: en
Available languages: en