Local crystal lattice curvature measurements for bent-crystal spectrometers
The geometrical orientation and curvature radius of the lattice of cylindrically bent crystals in high-resolution X-ray spectrometers for plasma diagnostics are determined locally on the crystal surface. This is done by means of a double-crystal device in conjunction with precise transverse displacements of the X-ray beam and accurate angular recordings of the crystal. Surface areas of the crystal which have imperfect orientation and curvature quality and hence contribute to resolving power degradation are thus clearly identified.
Bibliographic Reference: Article: Review of Scientific Instruments, Vol. 61 (1990) No. 1, pp. 121-123
Record Number: 199011422 / Last updated on: 1994-12-02
Original language: en
Available languages: en