A set of X-ray fluorescence reference sources for the intrinsic efficiency calibration of Si (Li) detectors down to 1 keV
X-ray fluorescence sources were prepared and their emission rates certified with an accuracy of better than 2%. The sources were standardised using a gas-flow proportional counter in a defined low-solid-angle setup. They were used for the efficiency calibration of a Si(Li) detector at the characteristic K X-ray energies of Al, P, S, Cl, Ca and Ti.
Bibliographic Reference: Article: Nuclear Instruments and Methods in Physics Research B, Volume 49 (1990) pp. 152-156
Record Number: 199011453 / Last updated on: 1994-12-02
Original language: en
Available languages: en