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Abstract

A new PIXE chamber is presented, designed for a high throughput of samples, which is ensured by a tight geometry of its components and an automated analysis cycle. The choice of appropriate materials for chamber walls, components and especially collimators rendering a low intrinsic chamber background is discussed. The chamber provides high analytical reproducibility (below 1%) due to well defined and stable geometric conditions, but nevertheless offers a wide adaptability to various analytical applications : it is possible to combine PIXE with complementary ion beam analysis techniques (e.g. RBS under 159 ) and to vary factors such as beam diameters (between 0.5 and 10 mm), the choice of absorber foils and detector entrance collimators, and scanning of the sample.

Additional information

Authors: WÄTJEN U, JRC Geel (BE);PRINS H, JRC Geel (BE);VAN BIJLEN R, JRC Geel (BE);LOUWERIX E, JRC Geel (BE)
Bibliographic Reference: Article: Nuclear Instruments and Methods in Physics Research B, Vol. 49 (1990) pp. 78-84
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