Lifetime measurements in solar cells of different thickness and in the related silicon wafers
Large area (above 100 cm2) CZ-silicon wafers, combined with appropriate low cost manufacturing technology, will probably be for several years one of the best choices for large scale and low cost solar cell production. The aim of this work is to test whether a technology based on a thick film technique limits the solar cell efficiency, by lowering the minority carriers' lifetime of the CZ commercial wafers. To decouple bulk and surface effects on carriers' lifetimes, samples of different thickness for the wafers and for the related solar cells are used. The experimental methods are photoconductivity decay for starting material and photocurrent decay and spectral responsivity for the devices. The results clearly show that the BSF practically eliminates the back surface recombination and that the technological processes do not significantly degrade the raw material lifetime.
Bibliographic Reference: Article: Solar Cells, Vol. 28 (1990) No. 4, pp. 287-292
Record Number: 199011821 / Last updated on: 1994-12-02
Original language: en
Available languages: en