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Abstract

The capabilities of different surface analytical techniques, of interest for the characterisation of glass, are described and illustrated by a cooperative investigation performed on three coated glasses. There is good agreement between the different approaches for the determination of the thickness of a coating, and elemental composition can also be obtained by Rutherford backscattering spectrometry, secondary ion mass spectrometry and X-ray photoelectron spectrometry. Rutherford backscattering spectrometry is non-destructive and gives quantitative information in a very short time but has a low sensitivity for elements with low mass. Chemical information, such as the valence state of elements and the type of bonding at interfaces, can only be obtained via X-ray photoelectron spectrometry. Secondary ion mass spectrometry is very sensitive for trace elements but requires extensive preliminary standardisation with samples of the same substrate.

Additional information

Authors: ARNOLD G W, Sandia National Laboratories (US);DELLA MEA G, Università di Trento (IT);DRAN J C, CSNSM/CNRS (FR);KAWAHARA H, Nippon Sheet Glass Co. Ltd. (JP);LEHUEDE P, Saint-Gobain Recherche (FR);MATZKE H-J, JRC Karlsruhe (DE);MAZZOLDI P, Università di Padova (IT);NOSHIRO M, Ashai Glass Co. Ltd. (JP);PANTANO C, Pennsylvania State University (US)
Bibliographic Reference: Article: Glass Technology, Vol. 31 (1990) No. 2, pp. 58-63
Record Number: 199011869 / Last updated on: 1994-12-02
Category: PUBLICATION
Original language: en
Available languages: en
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