Surface analysis of coated flat glasses: a comparison of various techniques
The capabilities of different surface analytical techniques, of interest for the characterisation of glass, are described and illustrated by a cooperative investigation performed on three coated glasses. There is good agreement between the different approaches for the determination of the thickness of a coating, and elemental composition can also be obtained by Rutherford backscattering spectrometry, secondary ion mass spectrometry and X-ray photoelectron spectrometry. Rutherford backscattering spectrometry is non-destructive and gives quantitative information in a very short time but has a low sensitivity for elements with low mass. Chemical information, such as the valence state of elements and the type of bonding at interfaces, can only be obtained via X-ray photoelectron spectrometry. Secondary ion mass spectrometry is very sensitive for trace elements but requires extensive preliminary standardisation with samples of the same substrate.
Bibliographic Reference: Article: Glass Technology, Vol. 31 (1990) No. 2, pp. 58-63
Record Number: 199011869 / Last updated on: 1994-12-02
Original language: en
Available languages: en