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Abstract

Measurements of the alpha-particle emission probabilities (P(alpha)) of 237Np were taken on two high-purity source materials of different origin, using a passivated implanted planar silicon detector. Two peak-fitting models were used to analyse the spectra. A substantial improvement in the accuracy of the P(alpha) data was obtained.

Additional information

Authors: BORTELS G ET AL., JRC Geel (BE);GARCIA-TORAÑO E, CIEMAT, Madrid (ES);ACEÑA M L, CIEMAT, Madrid (ES);WILTSHIRE R A P ET AL., AEA Harwell Laboratory, Oxfordshire (GB);BURGER P, Canberra Semiconductor N.V., Olen (BE)
Bibliographic Reference: Article: Nuclear Instruments and Methods in Physics Research, Vol. A295 (1990) pp. 199-206
Record Number: 199011874 / Last updated on: 1994-12-02
Category: PUBLICATION
Original language: en
Available languages: en
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