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Modern electron probe microanalysers are capable of making very precise measurements, but if the increased precision is to result in better quantitative information, conventional correction procedures must be continuously updated. The system structure of a microcomputer-based correction procedure is described and the organisation of the database demonstrated. The current version of the correction procedure is based upon the quadrilateral o(p,z) profile model developed by Love-Scott incorporating the tilt-factor formulated by Sewell et al.; Reeds characteristic fluorescence correction together with a continuum correction can be incorporated. Being a modular approach, it allows improvement of parameters and data which can parallel both theoretical and experimental advances. This structure gives operators an opportunity to tailor their correction procedure in their own way without any detailed knowledge of the system's overall configuration (operators need have no knowledge of the iterative processes involved in the program itself). This correction procedure is being developed initially for use on IBM-PC compatible machines in QuickBasic with further development into a multi-language environment envisaged within a year.

Additional information

Authors: FARTHING I, University of Bath, School of Materials Science, Bath (GB);LOVE G, University of Bath, School of Materials Science, Bath (GB);SCOTT V D, University of Bath, School of Materials Science, Bath (GB);WALKER C T, JRC Karlsruhe (DE)
Bibliographic Reference: Paper presented: Modern Developments and Applications in Microbeam Analysis, Dubrovnik (YU), May 14-18, 1991
Availability: Text not available
Record Number: 199110449 / Last updated on: 1994-12-02
Original language: en
Available languages: en
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