Low-temperature dynamic depth profile measurements of implanted deuterium in nickel : Precipitation of nickel deuteride
Measurements of the retention of deuterium in polycrystalline nickel have been obtained at 193 and 223 K through elastic-recoil detection using a 2.6MeV4He beam. The depth profiles obtained show striking differences from their counterparts measured at higher temperatures. Although the profiles are homogeneous at implanted fluences lower than 3 x 1.0 E18 D(+)/cm2, they present a large peak centred slightly deeper than the implantation range at higher fluences. Additional features develop as one implants further. The large peak is associated with the buildup of nickel deuteride. A one-dimensional computer model is developed which partly reproduces the features of the measured depth profiles.
Bibliographic Reference: Article: Journal of Applied Physics, Vol. 68 (1990) No.7, pp. 3169-3177
Record Number: 199110511 / Last updated on: 1994-12-02
Original language: en
Available languages: en