High-pressure X-ray diffraction study of ThOS and UOSe by synchrotron radiation
High-pressure X-ray diffraction studies were performed on ThOS up to 43.3 GPa and on UOSe up to 47.5 GPa, at room temperature, using a diamond anvil cell and synchrotron radiation. The tetragonal structure (P4/nmm) of these compounds was retained over the whole pressure range. The bulk modulus B(0) and its pressure derivative B(0)(') were determined for each compound.
Bibliographic Reference: Article: Journal of the Less-Common Metals, Vol. 171 (1991) pp. L9-L12
Record Number: 199111430 / Last updated on: 1994-12-02
Original language: en
Available languages: en