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Abstract

The document is the collection of the individual reports of the laboratories which participated in the intercomparison compaign for moisture measurement within TO5 semiconductor packages. The principal cause of discrepancies between laboratories' results in the moisture concentration range 1700-200 ppm was considered to arise from the different calibration methods employed.

Additional information

Authors: RIGBY L J, Standard Telecommunication Laboratories, Harlow (GB);HOUSLEY M, Ministry of Defence, Liverpool (GB);MCDONALD G L, Mullard Mitcham, Mitcham (GB);VLAEMINCK R, Bell Telephone Manufacturing Company, Gent (BE);BEAUHAIRE G, Aerospatiale, Suresnes (FR);KOPRIO J, Balzers Ltd., Balzers (LI)
Bibliographic Reference: EUR 13863 EN (1991) 215 pp., MF, ECU 12
Availability: (2)
Record Number: 199111434 / Last updated on: 1994-12-02
Category: PUBLICATION
Original language: en
Available languages: en
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