Intercomparison for moisture measurement within TO5 semiconductor packages
The document is the collection of the individual reports of the laboratories which participated in the intercomparison compaign for moisture measurement within TO5 semiconductor packages. The principal cause of discrepancies between laboratories' results in the moisture concentration range 1700-200 ppm was considered to arise from the different calibration methods employed.
Bibliographic Reference: EUR 13863 EN (1991) 215 pp., MF, ECU 12
Record Number: 199111434 / Last updated on: 1994-12-02
Original language: en
Available languages: en