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Abstract

During epitaxial growth of Fe on Cu(100) the normalised Auger signal of Fe was taken as a function of evaporation time. This curve shows evidence for a layer-by-layer growth mode and clearly rules out other possible growth modes. Rutherford backscattering spectrometry was used to determine quantitatively the thicknesses of a one- and two-layer film with an accuracy of +/- 0.3 ML. These data, together with the Auger analysis, unveil a bilayer-by-bilayer growth mode for the first two bilayers.

Additional information

Authors: GLATZEL H, Max-Planck-Institut für Plasmaphysik, Garching bei München (DE);FAUSTER T, Max-Planck-Institut für Plasmaphysik, Garching bei München (DE);SCHERZER B M U, Max-Planck-Institut für Plasmaphysik, Garching bei München (DE);DOSE V, Max-Planck-Institut für Plasmaphysik, Garching bei München (DE)
Bibliographic Reference: Article: Surface Science, Vol. 254 (1991) pp. 58-64
Record Number: 199111515 / Last updated on: 1994-12-02
Category: PUBLICATION
Original language: en
Available languages: en