Microstructure of silicon nitrides densified with Y(2)O(3) and Al(2)O(3)
When selecting materials, it is important to obtain as much information as possible on their microstructure. For a complete characterisation of the microstructure of fine-grained complex multiphase ceramics, the application of transmission microscopy is essential, particularly for obtaining information about intergranular phases, which is virtually unobtainable by other means. In this study the microstructures of two commercially available dense silicon nitrides densified with the aid of Y(2)O(3) and Al(2)O(3) are compared using X-ray diffraction analysis and scanning and transmission microscopy.
Bibliographic Reference: Paper presented: 2nd European Ceramic Society Conference, Augsburg (DE), Sept. 11-14, 1991
Availability: Available from (1) as Paper EN 36498 ORA
Record Number: 199210063 / Last updated on: 1994-12-02
Original language: en
Available languages: en