Near surface interface studies using glancing angle X-ray techniques : Application to corrosion of alloys and ion beam mixing of multi-layersFunded under: JRC-ADVMAT 1C
Three surface/interface sensitive X-ray analysis methods are described, all based on the glancing angle, or grazing incidence, geometry. The techniques are complementary, one giving information on the crystallographic structure of the sample (GAXRD), the second on the local atomic structure around specific atomic species (ReflEXAFS), and the last one (GXRR) on the surface morphology - ie. the thickness, density and interfacial roughnesses of thin films. Examples used to illustrate the techniques are studies of the oxidation of Y-implanted Ni-20Cr and Al coated Ni-20Cr, and the ion beam mixing of Ti/BN multilayers.
Bibliographic Reference: Paper presented: 6th International Conference on Intergranular and Interphase Boundaries in Materials, Thessaloniki (GR), June 21-26, 1992
Availability: Available from (1) as Paper EN 36905 ORA
Record Number: 199310116 / Last updated on: 1994-11-29
Original language: en
Available languages: en