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Abstract

Three surface/interface sensitive X-ray analysis methods are described, all based on the glancing angle, or grazing incidence, geometry. The techniques are complementary, one giving information on the crystallographic structure of the sample (GAXRD), the second on the local atomic structure around specific atomic species (ReflEXAFS), and the last one (GXRR) on the surface morphology - ie. the thickness, density and interfacial roughnesses of thin films. Examples used to illustrate the techniques are studies of the oxidation of Y-implanted Ni-20Cr and Al coated Ni-20Cr, and the ion beam mixing of Ti/BN multilayers.

Additional information

Authors: GIBSON P N, JRC Ispra (IT);CRABB T A, University of Strathclyde, Department of Pure and Applied Chemistry, Glasgow (GB);MCALPINE E, University of Strathclyde, Department of Applied Physics, Glasgow (GB);FALCONE R, CNRSM, Mesagne (IT)
Bibliographic Reference: Paper presented: 6th International Conference on Intergranular and Interphase Boundaries in Materials, Thessaloniki (GR), June 21-26, 1992
Availability: Available from (1) as Paper EN 36905 ORA
Record Number: 199310116 / Last updated on: 1994-11-29
Category: PUBLICATION
Original language: en
Available languages: en