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Above a certain level of damage on fission products, UO(2) grains are seen to subdivide into 1.0 E4 - 1.0 E5 subgrains (RIM effect). A parametric study with UO(2) single crystals and in situ ion implantation/channelling analysis was performed to investigate the basic mechanisms of this phenomenon. For most experiments, Xe-ions of up to 300 keV energy and up to doses of 1.0 E17 ions/cm2 were used. At a given critical dose, dramatic changes of the damage peak in the channelling spectra were seen. Though these peaks eventually reached the random yield, analysis of the peak shapes in X-ray diffraction measurements (Omega scans) and channelling angular scan measurements proved that polygonisation (rather than amorphisation) had occurred, causing a fine-grained polycrystalline structure with a misalignment between grains of a few degrees only. The mechanism of this process is discussed in terms of overpressurised gas bubbles causing microfractures and its relevance to the technological application is also considered.

Additional information

Authors: MATZKE H, JRC Karlsruhe (DE);TUROS A, JRC Karlsruhe (DE);LINKER G, KfK, Institut für Nukleare Festkörperphysik, Karlsruhe (DE)
Bibliographic Reference: Paper presented: 7th International Conference on Radiation Effects in Insulators (REI-7), Nagoya (JP), September 6-10, 1993
Availability: Available from (1) as Paper EN 37878 ORA
Record Number: 199311355 / Last updated on: 1994-11-28
Original language: en
Available languages: en
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