Optical fibre electronic speckle interferometry for automatic analysis of microdeformations
The development and use of a fibre optic interferometer for electronic speckle pattern interferometry (ESPI) is presented. The thermally induced phase fluctuations in the fibres are compensated by a control circuit. Phase stepping, necessary for the quantitative evaluation of the interferograms, is implemented by simply switching the polarity of the feedback loop. An application to an out-of-plane deformation measurement is presented in order to demonstrate the operation of the device.
Bibliographic Reference: Paper presented: 3 Convegno Nazionale 'Strumentazione e metodi di misura elettroottici', Pavia (IT), May 25-27, 1994
Availability: Available from (1) as Paper EN 38319 ORA
Record Number: 199410638 / Last updated on: 1994-11-28
Original language: it
Available languages: it