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Abstract

Scanning near-field optical microscopy (SNOM) is a new technique which can resolve objects with sub-wavelength resolution. This report explains the manufacture of optical probes for scanning the near-field optical microscope. The sharp tip is made by heating and stretching an optical fibre and then etching the tip in hydrofluoric acid. Features as small as 5 nm in height and less than 100 nm in width were observed with the fibre used in Digital Instruments Nanoscope II.

Additional information

Authors: SCHOCH B, Brunel University, The Brunel Centre for Manufacturing Metrology, Uxbridge (GB);JONES B E, Brunel University, The Brunel Centre for Manufacturing Metrology, Uxbridge (GB);FRANKS A, National Physical Laboratory, Teddington (GB)
Bibliographic Reference: Article: Institute of Physics Journals : Meas. Sci. Technol., Vol. 5 (1994) pp. 663-666
Record Number: 199411053 / Last updated on: 1994-11-28
Category: PUBLICATION
Original language: en
Available languages: en