Community Research and Development Information Service - CORDIS

Abstract

In this work the electronic speckle pattern interferometry (ESPI) system developed is used for the study of masonry specimens subjected to different test actions. It is an in-plane deformation inspection system which has been built up for an automatic acquisition of interferograms at different stages of a test. Qualitative and quantitative results are obtained and an overall discussion is presented.

Additional information

Authors: FACCHINI M, JRC Ispra (IT);ZANETTA P, JRC Ispra (IT);BINDA L, Politecnico di Milano, Institute of Structural Engineering (IT);ROBERTI G M, Politecnico di Milano, Institute of Structural Engineering (IT);TIRABOSCHI C, Politecnico di Milano, Institute of Structural Engineering (IT)
Bibliographic Reference: Paper presented: Applied Optics and Optoelectronics, York (GB), September 5-8, 1994
Availability: Available from (1) as Paper EN 38656 ORA
Record Number: 199411412 / Last updated on: 1994-12-06
Category: PUBLICATION
Original language: en
Available languages: en