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Abstract

This study deals with the diffusion of Zr in alpha-Ti using ion beam techniques to measure shallow penetration profiles non-destructively. Conventional Rutherford backscattering with He ions (RBS) was used in the temperature range 823-1012 K, and heavy ion Rutherford backscattering (HIRBS) in the range 873-1133 K. Arrhenius plots are presented for all the data calculated. In the temperature range in which both techniques were used, the agreement of the plots was fairly good. Outside this range a straight line was obtained for alpha-Ti whereas the results for alpha-Zr yielded a pronounced curve. The latter observation was believed to be due to an enhancement of self-diffusion by fast-diffusing impurities such as Fe forming rapidly diffusing impurity-vacancy pairs.

Additional information

Authors: LINKER G, Kernforschungzentrum Karlsruhe, Institute for Nuclear Solid State Physics (DE);PEREZ R A, Comisión Nacional de Energía Atómica, Dipartimento Ciencia de Materiales, Buenos Aires (AR);DYMENT F, Comisión Nacional de Energía Atómica, Dipartimento Ciencia de Materiales, Buenos Aires (AR);DHERS H, Comisión Nacional de Energía Atómica, Dipartimento Ciencia de Materiales, Buenos Aires (AR);MATZKE H, JRC Karlsruhe (DE)
Bibliographic Reference: Article: Journal of Nuclear Materials, Vol. 217 (1994) pp. 48-53
Record Number: 199510062 / Last updated on: 1995-01-10
Category: PUBLICATION
Original language: en
Available languages: en
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